[1]Hang Su, Ruifang Ye*, Fang Cheng, et al. A Straightness Error Compensation System for Topography Measurement Based on Thin Film Interferometry [J]. Photonics, 2021, 8(5): 149(1-18).
[2]Ruifang Ye, Chia-Sheng Pan, Pei-Yuan Hung, et al. Detection and Classification of Printed Circuit Board Assembly Defects Based on Deep Learning [J]. Journal of the Chinese Society of Mechanical Engineers, 2020, 41(4): 401-407.
[3]Ruifang Ye, Ming Chang, Chia-sheng Pan, et al. High-resolution optical inspection system for fast detection and classification of surface defects [J]. International Journal of Optomechatronics, 2018, 12(1): 1-10.
[4]Ruifang Ye, Chia-sheng Pan, Ming Chang, et al. Intelligent defect classification system based on deep learning [J]. Advances in Mechanical Engineering, 2018, 10(3):1-7.
[5]Ruifang Ye, Chia-sheng Pan, Ming Chang, et al. In-line inspection of surface feature and defect [J]. Microsystem Technologies, 2018, 24: 3233-3240
[6]Ruifang Ye, Xiangqian Jiang, Liam Blunt, et al. The application of3D-motif analysis to characterize diamond grinding wheel topography [J],Measurement,2016, 77: 73-79.